Rfq: Supply of Parameter Analyser for Use with Cryogenic Probe Station

GreatbritainTenders notice for Rfq: Supply of Parameter Analyser for Use with Cryogenic Probe Station. The reference ID of the tender is 57483480 and it is closing on 29 Sep 2021.

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Tender Details

  • Country: United Kingdom
  • Summary: Rfq: Supply of Parameter Analyser for Use with Cryogenic Probe Station
  • GBT Ref No: 57483480
  • Deadline: 29 Sep 2021
  • Competition: ICB
  • Financier: Self Financed
  • Purchaser Ownership: -
  • Tender Value: Refer Document
  • Notice Type: Tender
  • Document Ref. No.: tender_285450/998154
  • Purchaser's Detail :
  • Purchaser : NATIONAL PHYSICAL LABORATORY
    Hampton road Teddington TW11 0LW England
    Contact Person : Nina Heath
    Email :nina.heath@npl.co.uk

  • Description :
  • Title : RFQ: Supply of Parameter Analyser for Use with Cryogenic Probe Station
    Location Of Contract : TW11 0LW
    Industry : Laboratory, optical and precision equipments (excl. glasses) - 38000000
    Value Of Contract : £0
    Description : The National Physical Laboratory [NPL] requirement is for a parameter analyser to be used with a cryogenic (4K) probe station with four probes. The instrument will primary be used for on-wafer characterisation of superconducting devices but might also be used for other DUTs such as CMOS transistors. The probe station -manufactured by MicroXact- has four probes and a motorized (XY) chuck. It is designed for automated probing of devices across a wafer. An important task will be to measure a large number of devices in order to evaluate statistical properties related to parameter spread etc. The asset must enable the electrical characterisation of DUT based on the following1. Optimised for characterisation of highly ESD sensitive devices using small currents/voltages2. Current-voltage characterisation of two and three terminal devices3. Capacitance-voltage characterisation at frequencies 1 MHz4. Be supplied with a comprehensive software package 5. Should be possible to integrate with our automated probe station in a way that allows for unsupervised probing of many devices across a wafer. Requirement is for quantity of one.
    Published Date : 16 September 2021
    Closing Date : 29 Septe...
  • Documents :
  •  Tender Notice

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